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Unified Methods for VLSI Simulation and Test Generation

Cheng Kwang Ting,

Unified Methods for VLSI Simulation and Test Generation Textual Documents - Boston: Kulwer Academic Publisher., 1989. - xii/148: Hard Bond; 24*15.

ISBN: 07923 90253

Subjects--Index Terms: VLSI Design & Techn.

Dewey Class. No.: 621.395 / CHE/AGR

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