Sweeney, Patrick J. <br/><br/>
Comp TIA RFID+ Study Guide /   Textual Documents 
NULL. 
 - New York :   John Wiley & Sons, Inc. ,   2007. 
 - 790 ;   24*18. 
<br/><br/><label>ISBN: </label>  
<br/><br/><label>Subjects--Index Terms: </label>Data Security 
<br/><br/><label>Dewey Class. No.: </label>005.8  / SWE