TY  - BOOK
AU  - Abramovici M.,
AU  - Friedman A.,
TI  - Digital Systems Testing and Testable Design
SN  - 8172248911
U1  - 621.3815 
PY  - 2013///
CY  - Mumbai
PB  - Jaico Publishing House, Mumbai in arrangement with IEEE.
KW  - Solid State Devices & Circuits
ER  -