000 00370pam a2200145 a 4500
020 _c
041 _h
082 _a005.8
_bSWE
100 _aSweeney, Patrick J.
245 _aComp TIA RFID+ Study Guide /
_cNULL.
_hTextual Documents
260 _aNew York :
_bJohn Wiley & Sons, Inc. ,
_c2007.
300 _a790 ;
_c24*18.
653 _aData Security
930 _a264
999 _c119767
_d119767